SCAN18374T Datasheet PDF - TI

●The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

● IEEE 1149.1 (JTAG) Compliant

● Buffered Positive Edge-Triggered Clock

● Tri-State Outputs for Bus-Oriented Applications

● 9-bit Data Busses for Parity Applications

● Reduced-Swing Outputs Source 24 mA/Sink 48 mA (Mil)

● Ensured to Drive 50Ω Transmission Line to TTL Input Levels of 0.8V and 2.0V

● TTL Compatible Inputs

● 25 mil Pitch CLGA Packaging

● Includes CLAMP and HIGHZ Instructions

● Standard Microcircuit Drawing (SMD)

●5962-9320701