●The "BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
●In the normal mode, these devices are functionally equivalent to the "F374 and "BCT374 octal D-type flip-flops. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal flip-flops.
●In the test mode, the normal operation of the SCOPETM octal flip-flops is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations as described in IEEE Standard 1149.1-1990.
●Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
●The SN54BCT8374A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8374A is characterized for operation from 0°C to 70°C.
● Members of the Texas Instruments SCOPETM Family of Testability Products
● Octal Test-Integrated Circuits
● Functionally Equivalent to "F374 and "BCT374 in the Normal-Function Mode
● Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
● Test Operation Synchronous to Test Access Port (TAP)
● Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
● SCOPETM Instruction Set
● IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
● Parallel-Signature Analysis at Inputs
● Pseudo-Random Pattern Generation From Outputs
● Sample Inputs/Toggle Outputs
● Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs
●SCOPE is a trademark of Texas Instruments Incorporated.
