SN74BCT8374ADWE4 Datasheet PDF - TI

●description

●The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPEtestability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

●Members of the Texas Instruments SCOPEFamily of Testability Products

●Octal Test-Integrated Circuits

●Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode

●Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture

●Test Operation Synchronous to Test Access Port (TAP)

●Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin

●SCOPEInstruction Set

●  − IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ

●  − Parallel-Signature Analysis at Inputs

●  − Pseudo-Random Pattern Generation From Outputs

●  − Sample Inputs/Toggle Outputs

●Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs